ASU Electronic Theses and Dissertations
This collection includes most of the ASU Theses and Dissertations from 2011 to present. ASU Theses and Dissertations are available in downloadable PDF format; however, a small percentage of items are under embargo. Information about the dissertations/theses includes degree information, committee members, an abstract, supporting data or media.
In addition to the electronic theses found in the ASU Digital Repository, ASU Theses and Dissertations can be found in the ASU Library Catalog.
Dissertations and Theses granted by Arizona State University are archived and made available through a joint effort of the ASU Graduate College and the ASU Libraries. For more information or questions about this collection contact or visit the Digital Repository ETD Library Guide or contact the ASU Graduate College at gradformat@asu.edu.
- Arizona State University
- 1 Borror, Connie M.
- 1 Gel, Esma
- 1 Juarez, Joseph Moses
- 1 Mignolet, Marc
- 1 Montgomery, Douglas C.
- 1 Pan, Rong
- 1 English
- 1 Public
- Statistics
- Accelerated testing
- 1 Engineering
- 1 Interconnect Stress test
- 1 Lead free
- 1 Mechanical engineering
- 1 fatigue
- more
- 1 likelihood ratio test
- 1 vibration
- Dwarf Galaxies as Laboratories of Protogalaxy Physics: Canonical Star Formation Laws at Low Metallicity
- Evolutionary Genetics of CORL Proteins
- Social Skills and Executive Functioning in Children with PCDH-19
- Deep Domain Fusion for Adaptive Image Classification
- Software Defined Pulse-Doppler Radar for Over-The-Air Applications: The Joint Radar-Communications Experiment
This dissertation presents methods for addressing research problems that currently can only adequately be solved using Quality Reliability Engineering (QRE) approaches especially accelerated life testing (ALT) of electronic printed wiring boards with applications to avionics circuit boards. The methods presented in this research are generally applicable to circuit boards, but the data generated and their analysis is for high performance avionics. Avionics equipment typically requires 20 years expected life by aircraft equipment manufacturers and therefore ALT is the only practical way of performing life test estimates. Both thermal and vibration ALT induced failure are performed and analyzed to resolve industry …
- Contributors
- Juarez, Joseph Moses, Montgomery, Douglas C., Borror, Connie M., et al.
- Created Date
- 2012