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ASU Electronic Theses and Dissertations


This collection includes most of the ASU Theses and Dissertations from 2011 to present. ASU Theses and Dissertations are available in downloadable PDF format; however, a small percentage of items are under embargo. Information about the dissertations/theses includes degree information, committee members, an abstract, supporting data or media.

In addition to the electronic theses found in the ASU Digital Repository, ASU Theses and Dissertations can be found in the ASU Library Catalog.

Dissertations and Theses granted by Arizona State University are archived and made available through a joint effort of the ASU Graduate College and the ASU Libraries. For more information or questions about this collection contact or visit the Digital Repository ETD Library Guide or contact the ASU Graduate College at gradformat@asu.edu.


Resource Type
  • Masters Thesis
Date Range
2010 2019


Space exploration is a large field that requires high performing circuitry due to the harsh environment. Within a space environment one of the biggest factors leading to circuit failure is radiation. Circuits must be robust enough to continue operation after being exposed to the high doses of radiation. Bandgap reference (BGR) circuits are designed to be voltage references that stay stable across a wide range of supply voltages and temperatures. A bandgap reference is a piece of a large circuit that supplies critical elements of the large circuit with a constant voltage. When used in a space environment with large …

Contributors
Davis, Parker William, Barnaby, Hugh, Kitchen, Jennifer, et al.
Created Date
2019

VCO as a ubiquitous circuit in many systems is highly demanding for the phase noises. Lowering the noise migrated from the power supply has been the trending topics for many years. Considering the Ring Oscillator(RO) based VCO is more sensitive to the supply noise, it is more significant to find out a useful technique to reduce the supply noise. Among the conventional supply noise reduction techniques such as filtering, channel length adjusting for the transistors, and the current noise mutual canceling, the new feature of the 28nm UTBB-FD-SOI process launched by the ST semiconductor offered a new method to reduce …

Contributors
Tang, Miao, Barnaby, Hugh, Bakkaloglu, Bertan, et al.
Created Date
2018

The aging mechanism in devices is prone to uncertainties due to dynamic stress conditions. In AMS circuits these can lead to momentary fluctuations in circuit voltage that may be missed by a compact model and hence cause unpredictable failure. Firstly, multiple aging effects in the devices may have underlying correlations. The generation of new traps during TDDB may significantly accelerate BTI, since these traps are close to the dielectric-Si interface in scaled technology. Secondly, the prevalent reliability analysis lacks a direct validation of the lifetime of devices and circuits. The aging mechanism of BTI causes gradual degradation of the device …

Contributors
Patra, Devyani, Cao, Yu, Barnaby, Hugh, et al.
Created Date
2017

This thesis describes the design of a Single Event Transient (SET) duration measurement test-structure on the Global Foundries (previously IBM) 32-nm silicon-on insulator (SOI) process. The test structure is designed for portability and allows quick design and implementation on a new process node. Such a test structure is critical in analyzing the effects of radiation on complementary metal oxide semi-conductor (CMOS) circuits. The focus of this thesis is the change in pulse width during propagation of SET pulse and build a test structure to measure the duration of a SET pulse generated in real time. This test structure can estimate …

Contributors
Masand, Lovish, Clark, Lawrence, Holbert, Keith, et al.
Created Date
2017

The scaling of transistors has numerous advantages such as increased memory density, less power consumption and better performance; but on the other hand, they also give rise to many reliability issues. One of the major reliability issue is the hot carrier injection and the effect it has on device degradation over time which causes serious circuit malfunctions. Hot carrier injection has been studied from early 1980's and a lot of research has been done on the various hot carrier injection mechanisms and how the devices get damaged due to this effect. However, most of the existing hot carrier degradation models …

Contributors
Muthuseenu, Kiraneswar, Barnaby, Hugh, Kozicki, Michael, et al.
Created Date
2017

With the natural resources of earth depleting very fast, the natural resources of other celestial bodies are considered a potential replacement. Thus, there has been rise of space missions constantly and with it the need of more sophisticated spectrometer devices has increased. The most important requirement in such an application is low area and power consumption. To save area, some scintillators have been developed that can resolve both neutrons and gamma events rather than traditional scintillators which can do only one of these and thus, the spacecraft needs two such devices. But with this development, the requirements out of the …

Contributors
Gupta, Kush, Barnaby, Hugh, Hardgrove, Craig, et al.
Created Date
2017

Counterfeiting of goods is a widespread epidemic that is affecting the world economy. The conventional labeling techniques are proving inadequate to thwart determined counterfeiters equipped with sophisticated technologies. There is a growing need of a secure labeling that is easy to manufacture and analyze but extremely difficult to copy. Programmable metallization cell technology operates on a principle of controllable reduction of a metal ions to an electrodeposit in a solid electrolyte by application of bias. The nature of metallic electrodeposit is unique for each instance of growth, moreover it has a treelike, bifurcating fractal structure with high information capacity. These …

Contributors
Chamele, Ninad, Kozicki, Michael, Barnaby, Hugh, et al.
Created Date
2017

The market for high speed camera chips, or image sensors, has experienced rapid growth over the past decades owing to its broad application space in security, biomedical equipment, and mobile devices. CMOS (complementary metal-oxide-semiconductor) technology has significantly improved the performance of the high speed camera chip by enabling the monolithic integration of pixel circuits and on-chip analog-to-digital conversion. However, for low light intensity applications, many CMOS image sensors have a sub-optimum dynamic range, particularly in high speed operation. Thus the requirements for a sensor to have a high frame rate and high fill factor is attracting more attention. Another drawback …

Contributors
Zhao, Tong, Barnaby, Hugh, Mikkola, Esko, et al.
Created Date
2017

The formation of dendrites in materials is usually seen as a failure-inducing defect in devices. Naturally, most research views dendrites as a problem needing a solution while focusing on process control techniques and post-mortem analysis of various stress patterns with the ultimate goal of total suppression of the structures. However, programmable metallization cell (PMC) technology embraces dendrite formation in chalcogenide glasses by utilizing the nascent conductive filaments as its core operative element. Furthermore, exciting More-than-Moore capabilities in the realms of device watermarking and hardware encryption schema are made possible by the random nature of dendritic branch growth. While dendritic structures …

Contributors
Foss, Ryan Martin, Kozicki, Michael N, Barnaby, Hugh, et al.
Created Date
2016

Over decades, scientists have been scaling devices to increasingly smaller feature sizes for ever better performance of complementary metal-oxide semiconductor (CMOS) technology to meet requirements on speed, complexity, circuit density, power consumption and ultimately cost required by many advanced applications. However, going to these ultra-scaled CMOS devices also brings some drawbacks. Aging due to bias-temperature-instability (BTI) and Hot carrier injection (HCI) is the dominant cause of functional failure in large scale logic circuits. The aging phenomena, on top of process variations, translate into complexity and reduced design margin for circuits. Such issues call for “Design for Reliability”. In order to …

Contributors
BANSAL, ANKITA, Cao, Yu, Seo, Jae Sun, et al.
Created Date
2016