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ASU Electronic Theses and Dissertations


This collection includes most of the ASU Theses and Dissertations from 2011 to present. ASU Theses and Dissertations are available in downloadable PDF format; however, a small percentage of items are under embargo. Information about the dissertations/theses includes degree information, committee members, an abstract, supporting data or media.

In addition to the electronic theses found in the ASU Digital Repository, ASU Theses and Dissertations can be found in the ASU Library Catalog.

Dissertations and Theses granted by Arizona State University are archived and made available through a joint effort of the ASU Graduate College and the ASU Libraries. For more information or questions about this collection contact or visit the Digital Repository ETD Library Guide or contact the ASU Graduate College at gradformat@asu.edu.


Resource Type
  • Masters Thesis
Date Range
2010 2018


Circuits on smaller technology nodes become more vulnerable to radiation-induced upset. Since this is a major problem for electronic circuits used in space applications, designers have a variety of solutions in hand. Radiation hardening by design (RHBD) is an approach, where electronic components are designed to work properly in certain radiation environments without the use of special fabrication processes. This work focuses on the cache design for a high performance microprocessor. The design tries to mitigate radiation effects like SEE, on a commercial foundry 45 nm SOI process. The design has been ported from a previously done cache design at …

Contributors
Xavier, Jerin, Clark, Lawrence T, Cao, Yu, et al.
Created Date
2012

The aging mechanism in devices is prone to uncertainties due to dynamic stress conditions. In AMS circuits these can lead to momentary fluctuations in circuit voltage that may be missed by a compact model and hence cause unpredictable failure. Firstly, multiple aging effects in the devices may have underlying correlations. The generation of new traps during TDDB may significantly accelerate BTI, since these traps are close to the dielectric-Si interface in scaled technology. Secondly, the prevalent reliability analysis lacks a direct validation of the lifetime of devices and circuits. The aging mechanism of BTI causes gradual degradation of the device …

Contributors
Patra, Devyani, Cao, Yu, Barnaby, Hugh, et al.
Created Date
2017

Negative bias temperature instability (NBTI) and channel hot carrier (CHC) are important reliability issues impacting analog circuit performance and lifetime. Compact reliability models and efficient simulation methods are essential for circuit level reliability prediction. This work proposes a set of compact models of NBTI and CHC effects for analog and mixed-signal circuit, and a direct prediction method which is different from conventional simulation methods. This method is applied in circuit benchmarks and evaluated. This work helps with improving efficiency and accuracy of circuit aging prediction. Dissertation/Thesis

Contributors
Zheng, Rui, Cao, Yu, Yu, Hongyu, et al.
Created Date
2011

Process variations have become increasingly important for scaled technologies starting at 45nm. The increased variations are primarily due to random dopant fluctuations, line-edge roughness and oxide thickness fluctuation. These variations greatly impact all aspects of circuit performance and pose a grand challenge to future robust IC design. To improve robustness, efficient methodology is required that considers effect of variations in the design flow. Analyzing timing variability of complex circuits with HSPICE simulations is very time consuming. This thesis proposes an analytical model to predict variability in CMOS circuits that is quick and accurate. There are several analytical models to estimate …

Contributors
Gummalla, Samatha, Chakrabarti, Chaitali, Cao, Yu, et al.
Created Date
2011

Speech recognition and keyword detection are becoming increasingly popular applications for mobile systems. While deep neural network (DNN) implementation of these systems have very good performance, they have large memory and compute resource requirements, making their implementation on a mobile device quite challenging. In this thesis, techniques to reduce the memory and computation cost of keyword detection and speech recognition networks (or DNNs) are presented. The first technique is based on representing all weights and biases by a small number of bits and mapping all nodal computations into fixed-point ones with minimal degradation in the accuracy. Experiments conducted on the …

Contributors
Arunachalam, Sairam, Chakrabarti, Chaitali, Seo, Jae-sun, et al.
Created Date
2016

Built-in-Self-Test (BiST) for transmitters is a desirable choice since it eliminates the reliance on expensive instrumentation to do RF signal analysis. Existing on-chip resources, such as power or envelope detectors, or small additional circuitry can be used for BiST purposes. However, due to limited bandwidth, measurement of complex specifications, such as IQ imbalance, is challenging. In this work, a BiST technique to compute transmitter IQ imbalances using measurements out of a self-mixing envelope detector is proposed. Both the linear and non linear parameters of the RF transmitter path are extracted successfully. We first derive an analytical expression for the output …

Contributors
Byregowda, Srinath, Ozev, Sule, Cao, Yu, et al.
Created Date
2012

During the past decade, different kinds of fancy functions are developed in portable electronic devices. This trend triggers the research of how to enhance battery lifetime to meet the requirement of fast growing demand of power in portable devices. DC-DC converter is the connection configuration between the battery and the functional circuitry. A good design of DC-DC converter will maximize the power efficiency and stabilize the power supply of following stages. As the representative of the DC-DC converter, Buck converter, which is a step down DC-DC converter that the output voltage level is smaller than the input voltage level, is …

Contributors
Fu, Chao, Bakkaloglu, Bertan, Cao, Yu, et al.
Created Date
2011

Articial Neural Network(ANN) has become a for-bearer in the field of Articial Intel- ligence. The innovations in ANN has led to ground breaking technological advances like self-driving vehicles,medical diagnosis,speech Processing,personal assistants and many more. These were inspired by evolution and working of our brains. Similar to how our brain evolved using a combination of epigenetics and live stimulus,ANN require training to learn patterns.The training usually requires a lot of computation and memory accesses. To realize these systems in real embedded hardware many Energy/Power/Performance issues needs to be solved. The purpose of this research is to focus on methods to study …

Contributors
Chowdary, Hidayatullah, Cao, Yu, Seo, JaeSun, et al.
Created Date
2018

Redundant Binary (RBR) number representations have been extensively used in the past for high-throughput Digital Signal Processing (DSP) systems. Data-path components based on this number system have smaller critical path delay but larger area compared to conventional two's complement systems. This work explores the use of RBR number representation for implementing high-throughput DSP systems that are also energy-efficient. Data-path components such as adders and multipliers are evaluated with respect to critical path delay, energy and Energy-Delay Product (EDP). A new design for a RBR adder with very good EDP performance has been proposed. The corresponding RBR parallel adder has a …

Contributors
Mahadevan, Rupa, Chakrabarti, Chaitali, Kiaei, Sayfe, et al.
Created Date
2011

In this thesis two methodologies have been proposed for evaluating the fault response of analog/RF circuits. These proposed approaches are used to evaluate the response of the faulty circuit in terms of specifications/measurements. Faulty response can be used to evaluate important test metrics like fail probability, fault coverage and yield coverage of given measurements under process variations. Once the models for faulty and fault free circuit are generated, one needs to perform Monte Carlo sampling (as opposed to Monte Carlo simulations) to compute these statistical parameters with high accuracy. The first method is based on adaptively determining the order of …

Contributors
Subrahmaniyan Radhakrishnan, Gurusubrahmaniyan, Ozev, Sule, Blain Christen, Jennifer, et al.
Created Date
2010

Coarse Grain Reconfigurable Arrays (CGRAs) are promising accelerators capable of achieving high performance at low power consumption. While CGRAs can efficiently accelerate loop kernels, accelerating loops with control flow (loops with if-then-else structures) is quite challenging. Techniques that handle control flow execution in CGRAs generally use predication. Such techniques execute both branches of an if-then-else structure and select outcome of either branch to commit based on the result of the conditional. This results in poor utilization of CGRA s computational resources. Dual-issue scheme which is the state of the art technique for control flow fetches instructions from both paths of …

Contributors
Rajendran Radhika, Shri Hari, Shrivastava, Aviral, Christen, Jennifer Blain, et al.
Created Date
2014

The design and development of analog/mixed-signal (AMS) integrated circuits (ICs) is becoming increasingly expensive, complex, and lengthy. Rapid prototyping and emulation of analog ICs will be significant in the design and testing of complex analog systems. A new approach, Programmable ANalog Device Array (PANDA) that maps any AMS design problem to a transistor-level programmable hardware, is proposed. This approach enables fast system level validation and a reduction in post-Silicon bugs, minimizing design risk and cost. The unique features of the approach include 1) transistor-level programmability that emulates each transistor behavior in an analog design, achieving very fine granularity of reconfiguration; …

Contributors
Xu, Cheng, Cao, Yu, Blain Christen, Jennifer, et al.
Created Date
2012

Over decades, scientists have been scaling devices to increasingly smaller feature sizes for ever better performance of complementary metal-oxide semiconductor (CMOS) technology to meet requirements on speed, complexity, circuit density, power consumption and ultimately cost required by many advanced applications. However, going to these ultra-scaled CMOS devices also brings some drawbacks. Aging due to bias-temperature-instability (BTI) and Hot carrier injection (HCI) is the dominant cause of functional failure in large scale logic circuits. The aging phenomena, on top of process variations, translate into complexity and reduced design margin for circuits. Such issues call for “Design for Reliability”. In order to …

Contributors
BANSAL, ANKITA, Cao, Yu, Seo, Jae Sun, et al.
Created Date
2016

ABSTRACT Developing new non-traditional device models is gaining popularity as the silicon-based electrical device approaches its limitation when it scales down. Membrane systems, also called P systems, are a new class of biological computation model inspired by the way cells process chemical signals. Spiking Neural P systems (SNP systems), a certain kind of membrane systems, is inspired by the way the neurons in brain interact using electrical spikes. Compared to the traditional Boolean logic, SNP systems not only perform similar functions but also provide a more promising solution for reliable computation. Two basic neuron types, Low Pass (LP) neurons and …

Contributors
An, Pei, Cao, Yu, Barnaby, Hugh, et al.
Created Date
2013

The recent flurry of security breaches have raised serious concerns about the security of data communication and storage. A promising way to enhance the security of the system is through physical root of trust, such as, through use of physical unclonable functions (PUF). PUF leverages the inherent randomness in physical systems to provide device specific authentication and encryption. In this thesis, first the design of a highly reliable resistive random access memory (RRAM) PUF is presented. Compared to existing 1 cell/bit RRAM, here the sum of the read-out currents of multiple RRAM cells are used for generating one response bit. …

Contributors
Shrivastava, Ayush, Chakrabarti, Chaitali, Yu, Shimeng, et al.
Created Date
2015

Memories play an integral role in today's advanced ICs. Technology scaling has enabled high density designs at the price paid for impact due to variability and reliability. It is imperative to have accurate methods to measure and extract the variability in the SRAM cell to produce accurate reliability projections for future technologies. This work presents a novel test measurement and extraction technique which is non-invasive to the actual operation of the SRAM memory array. The salient features of this work include i) A single ended SRAM test structure with no disturbance to SRAM operations ii) a convenient test procedure that …

Contributors
Ravi, Venkatesa Sarma, Cao, Yu, Bakkaloglu, Bertan, et al.
Created Date
2013

Vision is the ability to see and interpret any visual stimulus. It is one of the most fundamental and complex tasks the brain performs. Its complexity can be understood from the fact that close to 50% of the human brain is dedicated to vision. The brain receives an overwhelming amount of sensory information from the retina – estimated at up to 100 Mbps per optic nerve. Parallel processing of the entire visual field in real time is likely impossible for even the most sophisticated brains due to the high computational complexity of the task [1]. Yet, organisms can efficiently process …

Contributors
Gorthy, Sai Rama Srivatsava, Cao, Yu, Seo, Jae-sun, et al.
Created Date
2017