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Built-in-Self Test of Transmitter I/Q Mismatch and Nonlinearities Using Self-Mixing Envelope Detector

Abstract Built-in-Self-Test (BiST) for transmitters is a desirable choice since it eliminates the reliance on expensive instrumentation to do RF signal analysis. Existing on-chip resources, such as power or envelope detectors, or small additional circuitry can be used for BiST purposes. However, due to limited bandwidth, measurement of complex specifications, such as IQ imbalance, is challenging. In this work, a BiST technique to compute transmitter IQ imbalances using measurements out of a self-mixing envelope detector is proposed. Both the linear and non linear parameters of the RF transmitter path are extracted successfully. We first derive an analytical expression for the output signal. Using this expression, we devise test signals to isolate th... (more)
Created Date 2012
Contributor Byregowda, Srinath (Author) / Ozev, Sule (Advisor) / Cao, Yu (Committee member) / Yu, Hongbin (Committee member) / Arizona State University (Publisher)
Subject Electrical engineering / BiST / Built in Self test / IIP3 / I/Q mismatch / Nonlinearities
Type Masters Thesis
Extent 55 pages
Language English
Reuse Permissions All Rights Reserved
Note M.S. Electrical Engineering 2012
Collaborating Institutions Graduate College / ASU Library
Additional Formats MODS / OAI Dublin Core / RIS

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Description Dissertation/Thesis