Skip to main content

45-nm Radiation Hardened Cache Design


Abstract Circuits on smaller technology nodes become more vulnerable to radiation-induced upset. Since this is a major problem for electronic circuits used in space applications, designers have a variety of solutions in hand. Radiation hardening by design (RHBD) is an approach, where electronic components are designed to work properly in certain radiation environments without the use of special fabrication processes. This work focuses on the cache design for a high performance microprocessor. The design tries to mitigate radiation effects like SEE, on a commercial foundry 45 nm SOI process. The design has been ported from a previously done cache design at the 90 nm process node. The cache design is a 16 KB, 4 way set associative, write-through desig... (more)
Created Date 2012
Contributor Xavier, Jerin (Author) / Clark, Lawrence T (Advisor) / Cao, Yu (Committee member) / Allee, David R (Committee member) / Arizona State University (Publisher)
Subject Electrical engineering
Type Masters Thesis
Extent 116 pages
Language English
Copyright
Reuse Permissions All Rights Reserved
Note M.S. Electrical Engineering 2012
Collaborating Institutions Graduate College / ASU Library
Additional Formats MODS / OAI Dublin Core / RIS


  Full Text
3.3 MB application/pdf
Download Count: 3794

Description Dissertation/Thesis