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Testing of threshold logic latch based hybrid circuits

Abstract The advent of threshold logic simplifies the traditional Boolean logic to the single level multi-input function. Threshold logic latch (TLL), among implementations of threshold logic, is functionally equivalent to a multi-input function with an edge triggered flip-flop, which stands out to improve area and both dynamic and leakage power consumption, providing an appropriate design alternative. Accordingly, the TLL standard cell library is designed. Through technology mapping, hybrid circuit is generated by absorbing the logic cone backward from each flip-flip to get the smallest remaining feeder. With the scan test methodology adopted, design for testability (DFT) is proposed, including scan element design and scan chain insertion. Test syn... (more)
Created Date 2013
Contributor Hu, Yang (Author) / Vrudhula, Sarma (Advisor) / Barnaby, Hugh (Committee member) / Yu, Shimeng (Committee member) / Arizona State University (Publisher)
Subject Electrical engineering
Type Masters Thesis
Extent 90 pages
Language English
Reuse Permissions All Rights Reserved
Note M.S. Electrical Engineering 2013
Collaborating Institutions Graduate College / ASU Library
Additional Formats MODS / OAI Dublin Core / RIS

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Description Dissertation/Thesis