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Total Dose Simulation for High Reliability Electronics


Abstract New technologies enable the exploration of space, high-fidelity defense systems, lighting fast intercontinental communication systems as well as medical technologies that extend and improve patient lives. The basis for these technologies is high reliability electronics devised to meet stringent design goals and to operate consistently for many years deployed in the field. An on-going concern for engineers is the consequences of ionizing radiation exposure, specifically total dose effects. For many of the different applications, there is a likelihood of exposure to radiation, which can result in device degradation and potentially failure. While the total dose effects and the resulting degradation are a well-studied field and methodologies to... (more)
Created Date 2014
Contributor Schlenvogt, Garrett James (Author) / Barnaby, Hugh (Advisor) / Goodnick, Stephen (Committee member) / Vasileska, Dragica (Committee member) / Holbert, Keith (Committee member) / Arizona State University (Publisher)
Subject Electrical engineering / High Reliability / Medical Devices / Modeling / Radiation / Simulation / Total Dose
Type Doctoral Dissertation
Extent 137 pages
Language English
Copyright
Reuse Permissions All Rights Reserved
Note Ph.D. Electrical Engineering 2014
Collaborating Institutions Graduate College / ASU Library
Additional Formats MODS / OAI Dublin Core / RIS


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Description Dissertation/Thesis