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Structural Characterization and Optical Properties of Group IV Semiconductor Alloys


Abstract ABSTRACT This thesis focuses on structural characterizations and optical properties of Si, Ge based semiconductor alloys. Two material systems are characterized: Si-based III-V/IV alloys, which represent a possible pathway to augment the optical performance of elemental silicon as a solar cell absorber layer, and Ge-based Ge1-ySny and Ge1-x-ySixSny systems which are applicable to long wavelength optoelectronics. Electron microscopy is the primary tool used to study structural properties. Electron Energy Loss spectroscopy (EELS), Ellipsometry, Photoluminescence and Raman Spectroscopy are combined to investigate electronic band structures and bonding properties. The experiments are closely coupled with structural and property modeling and the... (more)
Created Date 2014
Contributor Jiang, Liying (Author) / Menendez, Jose (Advisor) / Kouvetakis, John (Advisor) / Smith, David J (Committee member) / Chizmeshya, Andrew V.G (Committee member) / Chamberlin, Ralph (Committee member) / Arizona State University (Publisher)
Subject Physics / group IV / optical properties / semiconductors / structural characterization
Type Doctoral Dissertation
Extent 231 pages
Language English
Copyright
Reuse Permissions All Rights Reserved
Note Ph.D. Physics 2014
Collaborating Institutions Graduate College / ASU Library
Additional Formats MODS / OAI Dublin Core / RIS


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Description Dissertation/Thesis