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Analog Fault Modeling, Simulation and Diagnosis


Abstract The research objective is fully differential op-amp with common mode feedback, which are applied in filter, band gap, Analog Digital Converter (ADC) and so on as a fundamental component in analog circuit. Having modeled various defect and analyzed corresponding probability, defect library could be built after reduced defect simulation.Based on the resolution of microscope scan tool, all these defects are categorized into four groups of defects by both function and location, bias circuit defect, first stage amplifier defect, output stage defect and common mode feedback defect, separately. Each fault result is attributed to one of these four region defects.Therefore, analog testing algorithm and automotive tool could be generated to assist te... (more)
Created Date 2014
Contributor Lu, Zhijian (Author) / Ozev, Sule (Advisor) / Kiaei, Sayfe (Committee member) / Ogras, Umit (Committee member) / Arizona State University (Publisher)
Subject Electrical engineering / analog fault / defect modeling / defect probability / defect simulation / diagnosis methodology
Type Masters Thesis
Extent 53 pages
Language English
Copyright
Reuse Permissions All Rights Reserved
Note M.S. Electrical Engineering 2014
Collaborating Institutions Graduate College / ASU Library
Additional Formats MODS / OAI Dublin Core / RIS


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Description Dissertation/Thesis