Skip to main content

Characterization of Electrostatic Potential and Trapped Charge in Semiconductor Nanostructures using Off-Axis Electron Holography

Abstract Off-axis electron holography (EH) has been used to characterize electrostatic potential, active dopant concentrations and charge distribution in semiconductor nanostructures, including ZnO nanowires (NWs) and thin films, ZnTe thin films, Si NWs with axial p-n junctions, Si-Ge axial heterojunction NWs, and Ge/LixGe core/shell NW.

The mean inner potential (MIP) and inelastic mean free path (IMFP) of ZnO NWs have been measured to be 15.3V±0.2V and 55±3nm, respectively, for 200keV electrons. These values were then used to characterize the thickness of a ZnO nano-sheet and gave consistent values. The MIP and IMFP for ZnTe thin films were measured to be 13.7±0.6V and 46±2nm, respectively, for 200keV electrons. A thin film expected to have a p-n ... (more)
Created Date 2015
Contributor Gan, Zhaofeng (Author) / McCartney, Martha R (Advisor) / Smith, David J (Advisor) / Drucker, Jeffery (Committee member) / Bennett, Peter A (Committee member) / Arizona State University (Publisher)
Subject Physics / Materials Science / Electron Holography / Nanowire / Semiconductor
Type Doctoral Dissertation
Extent 167 pages
Language English
Reuse Permissions All Rights Reserved
Note Doctoral Dissertation Physics 2015
Collaborating Institutions Graduate College / ASU Library
Additional Formats MODS / OAI Dublin Core / RIS

  Full Text
7.0 MB application/pdf
Download Count: 1682

Description Dissertation/Thesis