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Low-Overhead Built-In Self-Test for Advanced RF Transceiver Architectures


Abstract Due to high level of integration in RF System on Chip (SOC), the test access points are limited to the baseband and RF inputs/outputs of the system. This limited access poses a big challenge particularly for advanced RF architectures where calibration of internal parameters is necessary and ensure proper operation. Therefore low-overhead built-in Self-Test (BIST) solution for advanced RF transceiver is proposed. In this dissertation. Firstly, comprehensive BIST solution for RF polar transceivers using on-chip resources is presented. In the receiver, phase and gain mismatches degrade sensitivity and error vector magnitude (EVM). In the transmitter, delay skew between the envelope and phase signals and the finite envelope bandwidth can create... (more)
Created Date 2015
Contributor Jeong, Jae Woong (Author) / Ozev, Sule (Advisor) / Kitchen, Jennifer (Committee member) / Cao, Yu (Committee member) / Ogras, Umit (Committee member) / Arizona State University (Publisher)
Subject Electrical engineering / Built-In Self-Test / RF Transceiver
Type Doctoral Dissertation
Extent 140 pages
Language English
Copyright
Reuse Permissions All Rights Reserved
Note Doctoral Dissertation Electrical Engineering 2015
Collaborating Institutions Graduate College / ASU Library
Additional Formats MODS / OAI Dublin Core / RIS


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Description Dissertation/Thesis