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Post-silicon Validation of Radiation Hardened Microprocessor, Embedded Flash and Test Structures


Abstract Digital systems are essential to the technological advancements in space exploration. Microprocessor and flash memory are the essential parts of such a digital system. Space exploration requires a special class of radiation hardened microprocessors and flash memories, which are not functionally disrupted in the presence of radiation. The reference design ‘HERMES’ is a radiation-hardened microprocessor with performance comparable to commercially available designs. The reference design ‘eFlash’ is a prototype of soft-error hardened flash memory for configuring Xilinx FPGAs. These designs are manufactured using a foundry bulk CMOS 90-nm low standby power (LP) process. This thesis presents the post-silicon validation results of these designs.
Created Date 2016
Contributor Gogulamudi, Anudeep Reddy (Author) / Clark, Lawrence T (Advisor) / Holbert, Keith E (Committee member) / Brunhaver, John (Committee member) / Arizona State University (Publisher)
Subject Electrical engineering / Computer engineering / Post-silicon Validation / Radiation-hardened microprocessor / TID on embedded flash memory
Type Masters Thesis
Extent 75 pages
Language English
Copyright
Reuse Permissions All Rights Reserved
Note Masters Thesis Electrical Engineering 2016
Collaborating Institutions Graduate College / ASU Library
Additional Formats MODS / OAI Dublin Core / RIS


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Description Dissertation/Thesis