BagStack Classification for Data Imbalance Problems with Application to Defect Detection and Labeling in Semiconductor Units
|Abstract||Despite the fact that machine learning supports the development of computer vision applications by shortening the development cycle, finding a general learning algorithm that solves a wide range of applications is still bounded by the ”no free lunch theorem”. The search for the right algorithm to solve a specific problem is driven by the problem itself, the data availability and many other requirements.
Automated visual inspection (AVI) systems represent a major part of these challenging computer vision applications. They are gaining growing interest in the manufacturing industry to detect defective products and keep these from reaching customers. The process of defect detection and classification in semiconductor units is challenging due ... (more)
|Contributor||Haddad, Bashar Muneer (Author) / Karam, Lina (Advisor) / Li, Baoxin (Committee member) / He, Jingrui (Committee member) / Turaga, Pavan (Committee member) / Arizona State University (Publisher)|
|Note||Doctoral Dissertation Computer Engineering 2019|
|Collaborating Institutions||Graduate College / ASU Library|
|Additional Formats||MODS / OAI Dublin Core / RIS|