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Aging Predictive Models and Simulation Methods for Analog and Mixed-Signal Circuits


Abstract Negative bias temperature instability (NBTI) and channel hot carrier (CHC) are important reliability issues impacting analog circuit performance and lifetime. Compact reliability models and efficient simulation methods are essential for circuit level reliability prediction. This work proposes a set of compact models of NBTI and CHC effects for analog and mixed-signal circuit, and a direct prediction method which is different from conventional simulation methods. This method is applied in circuit benchmarks and evaluated. This work helps with improving efficiency and accuracy of circuit aging prediction.
Created Date 2011
Contributor Zheng, Rui (Author) / Cao, Yu (Advisor) / Yu, Hongyu (Committee member) / Bakkaloglu, Bertan (Committee member) / Arizona State University (Publisher)
Subject Electrical Engineering / aging model / analog / CHC / NBTI
Type Masters Thesis
Extent 78 pages
Language English
Copyright
Reuse Permissions All Rights Reserved
Note M.S. Electrical Engineering 2011
Collaborating Institutions Graduate College / ASU Library
Additional Formats MODS / OAI Dublin Core / RIS


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Description Dissertation/Thesis